Journal of Applied Optics, Volume. 42, Issue 5, 839(2021)

Method of microscopic imaging quality evaluation for board lens based on image parameter extraction of pinhole imaging

Bo LI... Fang WANG, Haowen LYU, Wei WU* and Hangxin WEI |Show fewer author(s)
Author Affiliations
  • School of Mechanical Engineering, Xi'an Shiyou University, Xi'an 710065, China
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    Figures & Tables(13)
    Schematic diagram of microscopic imaging system
    MTF extraction method
    Distribution diagram of CMOS image spot
    MTF extraction of spot image
    System imaging model
    Tested board lens
    and curves of board lens (β=1.5)镜头和曲线(β=1.5)
    and curves of board lens (β=2.0)镜头和曲线(β=2.0)
    RGB bitmap image of board lens
    Comparison of average power spectrum curves
    • Table 1. Component parameters of test system

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      Table 1. Component parameters of test system

      部件名称规格参数
      CMOS$ 1/{4}^{"}$CMOS,分辨率为640×480像素, 像元尺寸6 μm×6 μm
      4款镜头焦距f = 8.0 mm,光圈数 F# = 2.0,出瞳D=5.0 mm
      星点靶标透光圆孔直径 d = 0.1 mm
      LED平板光源主波长λ ≈ 500 nm
    • Table 2. Evaluation parameter values of tested board lens

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      Table 2. Evaluation parameter values of tested board lens

      放大倍率参数指标
      Lens1Lens2Lens3Lens4
      $\;\beta = 1.5$${\overline \sigma _{_{{\rm{AS}}}}}$13.904 915.542 614.303 614.310 8
      ${\overline \sigma _{_{{\rm{AM}}}}}$10.815 713.141 311.447 111.752 0
      $\overline \delta /{\text{%}} $13.8910.5312.4811.92
      $\; \beta = 2.0$${\overline \sigma _{_{{\rm{AS}}}}}$11.603 012.122 411.744 511.932 9
      ${\overline \sigma _{_{{\rm{AM}}}}}$8.594 39.568 68.964 69.175 8
      $\overline \delta /\% $12.9610.3011.8411.56
    • Table 3. Definition evaluation parameters of board lens RGB bitmap images

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      Table 3. Definition evaluation parameters of board lens RGB bitmap images

      参数指标
      Lens1Lens2Lens3Lens4
      APSV2.043 82.720 22.204 42.448 3
      GMG7.885 217.024 411.556 914.277 8
      LS31.884 294.921 264.453 877.009 8
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    Bo LI, Fang WANG, Haowen LYU, Wei WU, Hangxin WEI. Method of microscopic imaging quality evaluation for board lens based on image parameter extraction of pinhole imaging[J]. Journal of Applied Optics, 2021, 42(5): 839

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    Paper Information

    Category: OE INFORMATION ACQUISITION AND PROCESSING

    Received: Jan. 21, 2021

    Accepted: --

    Published Online: Oct. 26, 2021

    The Author Email: WU Wei (wuwei@xsyu.edu.cn)

    DOI:10.5768/JAO202142.0502003

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