Acta Optica Sinica, Volume. 26, Issue 8, 1192(2006)

Novel Optimization Algorithm for Dose Control Parameters in Step and Scan Lithography

[in Chinese]1,2、* and [in Chinese]1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(6)

    [1] [1] Das P. Excimer laser as a total light source solution for DUV microlithography[C]. Proc. SPIE, 2001, 4184: 323~329

    [2] [2] Levinson H J.. Principles of Lithography[M]. Washington: SPIE Press, 2001

    [3] [3] Kivenzor G J.. Self-sustaining dose control system: ways to improve the exposure process[C]. Proc. SPIE, 2000, 4000: 835~842

    [4] [4] Brink M, Jasper H, Slonaker S et al.. Step-and-scan and step-and-repeat, a technology comparison[C]. Proc. SPIE, 1996, 2726: 734~753

    [5] [5] Colon D J. New lithography excimer light source technology for ArF (193-nm) semiconductor manufacturing[C]. Proc. of IEEE/SEMI Advanced Manufacturing Conference, 2003. 304~309

    [6] [6] Govorkov S V, Wiessner A O, Hua G et al.. Sub-0.25-pm 50-W amplified excimer laser system for 193-nm lithography[C]. Proc. SPIE, 2004, 5377: 1787~1796

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    [in Chinese], [in Chinese]. Novel Optimization Algorithm for Dose Control Parameters in Step and Scan Lithography[J]. Acta Optica Sinica, 2006, 26(8): 1192

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    Paper Information

    Category: Lasers and Laser Optics

    Received: Jul. 5, 2005

    Accepted: --

    Published Online: Mar. 15, 2007

    The Author Email: (shyliu@mail.hust.edu.cn)

    DOI:

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