Journal of Applied Optics, Volume. 44, Issue 3, 614(2023)
New defect characterization mass map in fringe reflection method
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Yunshuo QIN, Yongjian ZHU, Guofeng QIN, Dong WANG. New defect characterization mass map in fringe reflection method[J]. Journal of Applied Optics, 2023, 44(3): 614
Category: Research Articles
Received: Jul. 30, 2022
Accepted: --
Published Online: Jun. 19, 2023
The Author Email: ZHU Yongjian (zguyongjian_hn@126.com)