Journal of Applied Optics, Volume. 44, Issue 3, 614(2023)

New defect characterization mass map in fringe reflection method

Yunshuo QIN1... Yongjian ZHU2,*, Guofeng QIN3 and Dong WANG2 |Show fewer author(s)
Author Affiliations
  • 1School of Electronic Engineering, Guangxi Normal University, Guilin 541004, China
  • 2School of Computer Science and Information Engineering, Shanghai Institute of Technology, Shanghai 201418, China
  • 3Teachers College for Vocational and Technical Education, Guangxi Normal University, Guilin 541004, China
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    References(5)

    [1] [1] SONG Yiping. Research on three dimensional shape measurement method of mobile phone glass panel based on fringe reflection[D]. Chengdu: University of Electronic Science and Technology of China, 2019.

    [2] [2] YUE Huimin. Research on three-dimensional profilometry based on temporal phase unwrapping[D]. Chengdu: Sichuan University, 2005.

    [4] [4] SONG Lei. Three-dimensional shape measurement based on fringe projection and fringe reflection[D]. Chengdu: University of Electronic Science and Technology of China, 2012.

    [5] [5] FLYNN T J. Consistent 2-D phase unwrapping guided by a quality map[C]//IEEE International Symposium on Geoscience and Remote Sensing (IGARSS). Lincolnshire: IEEE, 2002: 2057-2059.

    [14] [14] GHIGLIA D, PRITT M D. Robust two-dimensional weighted and unweighted phase unwrapping that uses fast transforms and iterative methods[J]. JOSA A, 1994, 11(1): 107-117.

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    Yunshuo QIN, Yongjian ZHU, Guofeng QIN, Dong WANG. New defect characterization mass map in fringe reflection method[J]. Journal of Applied Optics, 2023, 44(3): 614

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    Paper Information

    Category: Research Articles

    Received: Jul. 30, 2022

    Accepted: --

    Published Online: Jun. 19, 2023

    The Author Email: ZHU Yongjian (zguyongjian_hn@126.com)

    DOI:10.5768/JAO202344.0303006

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