Journal of Applied Optics, Volume. 44, Issue 3, 614(2023)

New defect characterization mass map in fringe reflection method

Yunshuo QIN1... Yongjian ZHU2,*, Guofeng QIN3 and Dong WANG2 |Show fewer author(s)
Author Affiliations
  • 1School of Electronic Engineering, Guangxi Normal University, Guilin 541004, China
  • 2School of Computer Science and Information Engineering, Shanghai Institute of Technology, Shanghai 201418, China
  • 3Teachers College for Vocational and Technical Education, Guangxi Normal University, Guilin 541004, China
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    Figures & Tables(10)
    Four-step phase shift gray image
    Simulated interference fringe pattern and wrapped phase image
    Wrapped phase images before and after adding noises
    Unwrapped phase images
    Wrapped phase images before and after adding invalid regions
    Unwrapped effect images and corresponding mass maps
    Device for defects detection of drum roller
    Drum roller and its degree of modulation
    Mass maps of drum roller
    • Table 1. Comparison of performance parameters of four phase-unwrapping algorithms

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      Table 1. Comparison of performance parameters of four phase-unwrapping algorithms

      PDVMGVMPGVMSGV
      SNR6.46436.075537.217338.2827
      PSNR23.229322.840553.982355.0476
      RMSE3.09133.38090.20950.2034
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    Yunshuo QIN, Yongjian ZHU, Guofeng QIN, Dong WANG. New defect characterization mass map in fringe reflection method[J]. Journal of Applied Optics, 2023, 44(3): 614

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    Paper Information

    Category: Research Articles

    Received: Jul. 30, 2022

    Accepted: --

    Published Online: Jun. 19, 2023

    The Author Email: ZHU Yongjian (zguyongjian_hn@126.com)

    DOI:10.5768/JAO202344.0303006

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