Journal of Applied Optics, Volume. 44, Issue 3, 614(2023)
New defect characterization mass map in fringe reflection method
Fig. 2. Simulated interference fringe pattern and wrapped phase image
Fig. 5. Wrapped phase images before and after adding invalid regions
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Yunshuo QIN, Yongjian ZHU, Guofeng QIN, Dong WANG. New defect characterization mass map in fringe reflection method[J]. Journal of Applied Optics, 2023, 44(3): 614
Category: Research Articles
Received: Jul. 30, 2022
Accepted: --
Published Online: Jun. 19, 2023
The Author Email: ZHU Yongjian (zguyongjian_hn@126.com)