Opto-Electronic Advances, Volume. 1, Issue 6, 180011-1(2018)
Probing defects in ZnO by persistent phosphorescence
[2] [2] JagadishCPeartonS JZinc Oxide Bulk, Thin Films and Nanostructures: Processing, Properties, and Applications (Elsevier, Amsterdam, 2006)Jagadish C, Pearton S J. Zinc Oxide Bulk, Thin Films and Nanostructures: Processing, Properties, and Applications (Elsevier, Amsterdam, 2006).
[3] [3] KlingshirnC FWaagAHoffmannAGeurtsJZinc Oxide: From Fundamental Properties Towards Novel Applications (Springer, Berlin Heidelberg, 2010)Klingshirn C F, Waag A, Hoffmann A, Geurts J. Zinc Oxide: From Fundamental Properties Towards Novel Applications (Springer, Berlin Heidelberg, 2010).
[4] [4] SunX WYiYZnO Nanostructures and Their Applications (CRC Press, New York, 2016)Sun X W, Yi Y. ZnO Nanostructures and Their Applications (CRC Press, New York, 2016).
[27] R Heitz, A Hoffmann, I Broser. Fe3+ center in ZnO. Phys Rev B, 45, 8977-8988(1992).
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Honggang Ye, Zhicheng Su, Fei Tang, Yitian Bao, Xiangzhou Lao, Guangde Chen, Jian Wang, Shijie Xu. Probing defects in ZnO by persistent phosphorescence[J]. Opto-Electronic Advances, 2018, 1(6): 180011-1
Received: May. 24, 2018
Accepted: Jul. 19, 2018
Published Online: Mar. 19, 2019
The Author Email: Xu Shijie (sjxu@hku.hk)