Opto-Electronic Advances, Volume. 1, Issue 6, 180011-1(2018)

Probing defects in ZnO by persistent phosphorescence

Honggang Ye1...2, Zhicheng Su1, Fei Tang1, Yitian Bao1, Xiangzhou Lao1, Guangde Chen2, Jian Wang1 and Shijie Xu1,* |Show fewer author(s)
Author Affiliations
  • 1Department of Physics, and Shenzhen Institute of Research and Innovation (HKU-SIRI), The University of Hong Kong, Pokfulam Road, Hong Kong, China
  • 2Department of Applied Physics, Xi'an Jiaotong University, Xi'an 710049, China
  • show less
    References(47)

    [2] [2] JagadishCPeartonS JZinc Oxide Bulk, Thin Films and Nanostructures: Processing, Properties, and Applications (Elsevier, Amsterdam, 2006)Jagadish C, Pearton S J. Zinc Oxide Bulk, Thin Films and Nanostructures: Processing, Properties, and Applications (Elsevier, Amsterdam, 2006).

    [3] [3] KlingshirnC FWaagAHoffmannAGeurtsJZinc Oxide: From Fundamental Properties Towards Novel Applications (Springer, Berlin Heidelberg, 2010)Klingshirn C F, Waag A, Hoffmann A, Geurts J. Zinc Oxide: From Fundamental Properties Towards Novel Applications (Springer, Berlin Heidelberg, 2010).

    [4] [4] SunX WYiYZnO Nanostructures and Their Applications (CRC Press, New York, 2016)Sun X W, Yi Y. ZnO Nanostructures and Their Applications (CRC Press, New York, 2016).

    [27] R Heitz, A Hoffmann, I Broser. Fe3+ center in ZnO. Phys Rev B, 45, 8977-8988(1992).

    Tools

    Get Citation

    Copy Citation Text

    Honggang Ye, Zhicheng Su, Fei Tang, Yitian Bao, Xiangzhou Lao, Guangde Chen, Jian Wang, Shijie Xu. Probing defects in ZnO by persistent phosphorescence[J]. Opto-Electronic Advances, 2018, 1(6): 180011-1

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Received: May. 24, 2018

    Accepted: Jul. 19, 2018

    Published Online: Mar. 19, 2019

    The Author Email: Xu Shijie (sjxu@hku.hk)

    DOI:10.29026/oea.2018.180011

    Topics