Opto-Electronic Advances, Volume. 1, Issue 6, 180011-1(2018)
Probing defects in ZnO by persistent phosphorescence
Fig. 1. (Colour on-line) PL spectra of the ZnO bulk crystal at 10 K.(
Fig. 2. (
Fig. 3. (Colour on-line) Variable-temperature PL spectra of the sample under the continuous excitation of 450 nm laser.
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Honggang Ye, Zhicheng Su, Fei Tang, Yitian Bao, Xiangzhou Lao, Guangde Chen, Jian Wang, Shijie Xu. Probing defects in ZnO by persistent phosphorescence[J]. Opto-Electronic Advances, 2018, 1(6): 180011-1
Received: May. 24, 2018
Accepted: Jul. 19, 2018
Published Online: Mar. 19, 2019
The Author Email: Xu Shijie (sjxu@hku.hk)