Opto-Electronic Engineering, Volume. 51, Issue 11, 240194-1(2024)

A scanning micro phase measuring profilometry based on optical flow pixel matching

Siyuan Wang... Yuankun Liu* and Xin Yu |Show fewer author(s)
Author Affiliations
  • School of Electronics and Information Engineering, Sichuan University, Chendu, Sichuan 610065, China
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    Siyuan Wang, Yuankun Liu, Xin Yu. A scanning micro phase measuring profilometry based on optical flow pixel matching[J]. Opto-Electronic Engineering, 2024, 51(11): 240194-1

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    Paper Information

    Category: Article

    Received: Aug. 19, 2024

    Accepted: Sep. 26, 2024

    Published Online: Jan. 24, 2025

    The Author Email: Liu Yuankun (刘元坤)

    DOI:10.12086/oee.2024.240194

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