Opto-Electronic Engineering, Volume. 51, Issue 11, 240194-1(2024)
A scanning micro phase measuring profilometry based on optical flow pixel matching
[1] D Y Chu, G H Zhang, R J Song et al. Priori knowledge assisted dynamic 3D shape measurement with fringe projection. Opto-Electron Eng, 49, 210449(2022).
[2] Z L Xiang, Q C Zhang, Z J Wu. 3D shape measurement and texture mapping method based on structured light projection. Opto-Electron Eng, 49, 220169(2022).
[3] X L Ying, J Y Yao, X S Zhang et al. Fringe projection based three-dimensional measurement system by the light-source-stepping method using LD. Opto-Electron Eng, 48, 210298(2021).
[4] J F Shao, Y B Ni, Z Z Meng et al. Three-dimensional shape measurement of composite surface based on defocused binary display and fringe projection. Opto-Electron Eng, 51, 240024(2024).
[5] Y F Peng, J K He, X P Huang et al. Ultra-precision grinding and polishing processing technology research and equipment development. Opto-Electron Eng, 50, 220097(2023).
[6] X Y Su, W J Chen. Fourier transform profilometry: a review. Opt Lasers Eng, 35, 263-284(2001).
[7] H T Wu, Y P Cao, H H An et al. Ultrafast spatial phase unwrapping algorithm with accurately correcting transient phase error. Opt Lett, 46, 6091-6094(2021).
[8] K H Wu, W J Wang. Detection method of obstacle for plant protection UAV based on structured light vision. Opto-Electron Eng, 45, 170613(2018).
[9] Z X Dai, G H Yang, Y H Gao et al. Research on large displacement measurement method based on servo 3D vision. Acta Opt Sin, 44, 1912002(2024).
[10] Q J Wang, Y K Liu, Z D Wei et al. Adaptive fringe projection algorithm based on region mapping for high-reflectivity surfaces. Laser J, 45, 34-40(2024).
[11] A P Zhai, Y P Cao, Z F Huang. On-line phase measuring profilometry based on a single frame of deformed pattern. Optik, 123, 1311-1315(2012).
[12] H T Wu, Y P Cao, Y Li et al. Online three-dimension measurement based on improved grid motion statistical features. Acta Photonica Sin, 50, 0112002(2021).
[13] Y C Wu, Y P Cao, M T Lu et al. An on-line phase measuring profilometry based on modulation. Opt Appl, 42, 31-41(2012).
[14] K Peng, Y P Cao, Y C Wu et al. On-line three-dimensional measurement method based on low modulation feature. Chin J Lasers, 40, 0708006(2013).
[15] W X Zhang, Y H Luo, Y Q Liu et al. Image super-resolution reconstruction based on active displacement imaging. Opto-Electron Eng, 51, 230290(2024).
[16] R Z Yu, Y P Cao. A three dimensional on-line inspecting method for workpiece by PMP. Acta Photonica Sin, 37, 1139-1143(2008).
[17] X Zheng, Y P Cao, K Li. An on-line 3D measurement method based on modulation delamination. Acta Opt Sin, 30, 2573-2577(2010).
[18] X F Xu, Y P Cao, K Peng. Pixel matching method in on-line three-dimensional measurement based on phase prediction. Acta Opt Sin, 36, 0612005(2016).
[20] Y K Liu, X Yu, J P Xue et al. A flexible phase error compensation method based on probability distribution functions in phase measuring profilometry. Opt Laser Technol, 129, 106267(2020).
Get Citation
Copy Citation Text
Siyuan Wang, Yuankun Liu, Xin Yu. A scanning micro phase measuring profilometry based on optical flow pixel matching[J]. Opto-Electronic Engineering, 2024, 51(11): 240194-1
Category: Article
Received: Aug. 19, 2024
Accepted: Sep. 26, 2024
Published Online: Jan. 24, 2025
The Author Email: Liu Yuankun (刘元坤)