Acta Photonica Sinica, Volume. 48, Issue 12, 1248006(2019)

Detection Efficiency Measurement of Silicon Single-photon Avalanche Detector Traceable Using Standard Detector

Chang-ming LIU1...1,2,2, Xue-shun SHI1,1,2,2,*, Peng-ju ZHANG1,1,2,2, Xin-gang ZHUANG1,1,2,2, and Hong-bo LIU1,1,22 |Show fewer author(s)
Author Affiliations
  • 1The 41 st Research Institute of China Electronic Science and Technology Group, Qingdao, Shandong 266555, China
  • 2National Opto-Electronic Primary Metrology Laboratory, Qingdao, Shandong 266555, China
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    References(16)

    [6] [6] POLYAKOV S V, MIGDALL A. High accuracycalibration of photoncounting detects "on dem"[C]. SPIE, 2007, 6583: 65830A.

    [20] [20] Excelitas Technologies. Excelitas SPCMAQRH family datasheet[NOL]. (201812)[20190815]. https:www.excelitas.comproductspcmaqrh.

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    Chang-ming LIU, Xue-shun SHI, Peng-ju ZHANG, Xin-gang ZHUANG, Hong-bo LIU. Detection Efficiency Measurement of Silicon Single-photon Avalanche Detector Traceable Using Standard Detector[J]. Acta Photonica Sinica, 2019, 48(12): 1248006

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    Paper Information

    Received: Aug. 16, 2019

    Accepted: Oct. 23, 2019

    Published Online: Mar. 17, 2020

    The Author Email: SHI Xue-shun (xshshi@163.com)

    DOI:10.3788/gzxb20194812.1248006

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