Acta Photonica Sinica, Volume. 48, Issue 12, 1248006(2019)
Detection Efficiency Measurement of Silicon Single-photon Avalanche Detector Traceable Using Standard Detector
Figures & Tables(5)
Fig. 1. Si-SPAD探测效率测量装置示意图Schematic setup for the detection efficiency measurement of Si-SPAD
Fig. 2. Si-SPAD后脉冲概率测量装置原理图Schematic diagram for the afterpulse probability of Si-SPAD
Table 1. Detection efficiency measurement of Si-APD using standard detector
View tableView in ArticleTable 1. Detection efficiency measurement of Si-APD using standard detector
Year Uncertainty( k =1)Wavelength/nm Measurement of additional parameters Reference 2000 ~1% 632.8 Dead time [ 1 ]2005 6.8% 632.8 Dead time [ 3 ]2007 0.17% 702 Dead time and afterpulsing [ 5 ]2015 0.31% 770 Dead time [ 8 ]2016 0.16% 770 / [ 9 ]This work 0.3% 632.8 Dead time and afterpulsing /
Table 2. Measurement uncertainty budget
View tableView in ArticleTable 2. Measurement uncertainty budget
Source of uncertainty Relative uncertainty of value/% Sensitivity coefficient Contribution/% Type A Type B 0.10 1 0.10 Total counting 0.15 1.007 0.151 Noise counting 4 0.008 0.032 Afterpulsing probability 10 0.005 0.05 Dead time 3 0.017 0.051 Voltage measurement 0.08 1 0.08 Amplifiers gain calibration 0.16 1 0.16 Power correction 0.09 1 0.09 Objective transmittance 0.05 1 0.05 Wavelength 0.06 1 0.06 Spectral responsivity@632.8 nm 0.05 1 0.05 Combined standard uncertainty 0.30 Expanded uncertainty ( k =2)0.6
Tools
Get Citation
Copy Citation Text
Chang-ming LIU, Xue-shun SHI, Peng-ju ZHANG, Xin-gang ZHUANG, Hong-bo LIU. Detection Efficiency Measurement of Silicon Single-photon Avalanche Detector Traceable Using Standard Detector[J]. Acta Photonica Sinica, 2019, 48(12): 1248006
Paper Information
Received: Aug. 16, 2019
Accepted: Oct. 23, 2019
Published Online: Mar. 17, 2020
The Author Email: SHI Xue-shun (xshshi@163.com)
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20