Microelectronics, Volume. 54, Issue 2, 282(2024)
Gate Charge Characterization Method for p-GaN HEMTs
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LIU Zhen, PAN Xiaofei, GONG Ping, WANG Yanping, YE Sican, LU Ao, YAN Dawei. Gate Charge Characterization Method for p-GaN HEMTs[J]. Microelectronics, 2024, 54(2): 282
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Received: Aug. 24, 2023
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Published Online: Aug. 21, 2024
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