Laser & Optoelectronics Progress, Volume. 53, Issue 1, 11201(2016)

Study on Measuring Technology of Surface Profile Based on Electronic Modulation Coherence

Dong Yuanli* and Wang Huilin
Author Affiliations
  • [in Chinese]
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    References(14)

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    Dong Yuanli, Wang Huilin. Study on Measuring Technology of Surface Profile Based on Electronic Modulation Coherence[J]. Laser & Optoelectronics Progress, 2016, 53(1): 11201

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 20, 2015

    Accepted: --

    Published Online: Feb. 3, 2016

    The Author Email: Yuanli Dong (784207137@qq.com)

    DOI:10.3788/lop53.011201

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