Laser & Optoelectronics Progress, Volume. 53, Issue 1, 11201(2016)
Study on Measuring Technology of Surface Profile Based on Electronic Modulation Coherence
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Dong Yuanli, Wang Huilin. Study on Measuring Technology of Surface Profile Based on Electronic Modulation Coherence[J]. Laser & Optoelectronics Progress, 2016, 53(1): 11201
Paper Information
Category: Instrumentation, Measurement and Metrology
Received: Jul. 20, 2015
Accepted: --
Published Online: Feb. 3, 2016
The Author Email: Yuanli Dong (784207137@qq.com)
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