Matter and Radiation at Extremes, Volume. 7, Issue 1, 015902(2022)

Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick–Baez microscope

S. Z. Yi1...2, J. Q. Dong3, L. Jiang1,2, Q. S. Huang1,2, E. F. Guo3, and Wang Z. S.12,a) |Show fewer author(s)
Author Affiliations
  • 1MOE Key Laboratory of Advanced Micro-Structured Materials, No. 1239 Siping Road, Shanghai 200092, China
  • 2School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
  • 3Shanghai Institute of Laser Plasma, CAEP, P.O. Box 919-988, Shanghai 201800, China
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    S. Z. Yi, J. Q. Dong, L. Jiang, Q. S. Huang, E. F. Guo, Wang Z. S.. Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick–Baez microscope[J]. Matter and Radiation at Extremes, 2022, 7(1): 015902

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    Paper Information

    Category: Inertial Confinement Fusion Physics

    Received: Jul. 8, 2021

    Accepted: Nov. 3, 2021

    Published Online: Apr. 6, 2022

    The Author Email: Z. S. Wang (wangzs@tongji.edu.cn)

    DOI:10.1063/5.0062758

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