Matter and Radiation at Extremes, Volume. 7, Issue 1, 015902(2022)

Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick–Baez microscope

S. Z. Yi1...2, J. Q. Dong3, L. Jiang1,2, Q. S. Huang1,2, E. F. Guo3, and Wang Z. S.12,a) |Show fewer author(s)
Author Affiliations
  • 1MOE Key Laboratory of Advanced Micro-Structured Materials, No. 1239 Siping Road, Shanghai 200092, China
  • 2School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
  • 3Shanghai Institute of Laser Plasma, CAEP, P.O. Box 919-988, Shanghai 201800, China
  • show less
    Figures & Tables(8)
    Schematic of simultaneous high-resolution x-ray backlighting and self-emission imaging by a two-channel multilayer KB microscope.
    Optical arrangement of the two-energy KB microscope in the meridional and sagittal directions.
    Spatial resolution of the KB microscope simulated by Zemax software.
    Spectral response of the KB microscope for x-ray backlighting and self-emission imaging.
    Results of evaluation of spatial resolution for a 600-mesh Au grid backlit by a copper x-ray tube.
    Simultaneous backlighting and self-emission x-ray imaging of a direct drive CH shell target, taken by the KB microscope and streak camera at the SG-III prototype laser facility.
    Outer-boundary trajectory (red line) of the capsule shell extracted from the upper half of the backlit image in Fig. 6 and the hotspot-emission history (blue line) extracted from the center of the self-emission image in Fig. 6.
    • Table 1. Optical parameters of the KB microscope.

      View table
      View in Article

      Table 1. Optical parameters of the KB microscope.

      MirrorR (m)d (mm)θ (deg)u (mm)v (mm)ML (mm)
      M1/M220.010.00.8462160.01920.012.00010.0
      M30.8945170.01910.011.235
    Tools

    Get Citation

    Copy Citation Text

    S. Z. Yi, J. Q. Dong, L. Jiang, Q. S. Huang, E. F. Guo, Wang Z. S.. Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick–Baez microscope[J]. Matter and Radiation at Extremes, 2022, 7(1): 015902

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Inertial Confinement Fusion Physics

    Received: Jul. 8, 2021

    Accepted: Nov. 3, 2021

    Published Online: Apr. 6, 2022

    The Author Email: Z. S. Wang (wangzs@tongji.edu.cn)

    DOI:10.1063/5.0062758

    Topics