Spectroscopy and Spectral Analysis, Volume. 32, Issue 4, 1142(2012)
Precision Measurement of the Birefringence of Quartz Crystal at 1 310 nm Based on the Spectroscopic Ellipsometer
References(5)
[1] [1] Hariharan P. Opt. Laser Technol.， 2002， 34： 509.
[2] [2] Ma Jun， Wang Jingshan， Carsten Denker, et al. Chin. J. Astron. Astrophys.， 2008， 8(3)： 349.
[3] [3] Tokunari M， Hayakawa H， Yamamoto K， et al. J. Phys.: Conference Series， 2006， 32： 432.
[6] [6] Hlubina P, Ciprian D. Opt. Commun., 2011, 284: 2683.
[7] [7] Born M, Wolf E. Principles of Optics, Seventh Edition. Cambridge University Press, Cambridge, 1999.
Tools
Get Citation
Copy Citation Text
HAN Pei-gao, HAO Dian-zhong, SONG Lian-ke, SU Fu-fang, SHI Meng, L Ting-fen, WU Fu-quan, LI Guo-hua. Precision Measurement of the Birefringence of Quartz Crystal at 1 310 nm Based on the Spectroscopic Ellipsometer[J]. Spectroscopy and Spectral Analysis, 2012, 32(4): 1142
Paper Information
Received: Jul. 8, 2011
Accepted: --
Published Online: Apr. 16, 2012
The Author Email: Pei-gao HAN (pghan@foxmail.com)
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20