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Spectroscopy and Spectral Analysis, Volume. 32, Issue 4, 1142(2012)

Precision Measurement of the Birefringence of Quartz Crystal at 1 310 nm Based on the Spectroscopic Ellipsometer

HAN Pei-gao*... HAO Dian-zhong, SONG Lian-ke, SU Fu-fang, SHI Meng, L Ting-fen, WU Fu-quan and LI Guo-hua |Show fewer author(s)
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    HAN Pei-gao, HAO Dian-zhong, SONG Lian-ke, SU Fu-fang, SHI Meng, L Ting-fen, WU Fu-quan, LI Guo-hua. Precision Measurement of the Birefringence of Quartz Crystal at 1 310 nm Based on the Spectroscopic Ellipsometer[J]. Spectroscopy and Spectral Analysis, 2012, 32(4): 1142

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    Paper Information

    Received: Jul. 8, 2011

    Accepted: --

    Published Online: Apr. 16, 2012

    The Author Email: Pei-gao HAN (pghan@foxmail.com)

    DOI:10.3964/j.issn.1000-0593(2012)04-1142-03

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology