Opto-Electronic Engineering, Volume. 40, Issue 11, 22(2013)

On-line Defect Detection Method Based on Two Image Acquisition Structures

YAO Hongbing*... ZENG Xiangbo, MA Guidian, ZHENG Xueliang, LI Yaru, GAO Yuan, YU Wenlong, GU Jinan and JIANG Guangping |Show fewer author(s)
Author Affiliations
  • [in Chinese]
  • show less
    References(11)

    [1] [1] Throop J A, Aneshansley D J, Anger W C, et al. Quality evaluation of apples based on surface defects:development of an automated inspection system [J]. Postharvest Biology and Technology(S0925-5214), 2005, 36(3):281-290.

    [2] [2] SHEN Hao, LI Shuxiao, GU Duoyu, et al. Bearing defect inspection based on machine vision [J]. Measurement (S0263-2241), 2012, 45(4):719-733.

    [3] [3] WU Bin, HAN Wenqiang, SHAO Zhenyu. Surface defects inspecting inside small bores based on machine vision [J]. Journal of Optoelectronics.Laser, 2012, 23(11):2137-2141.

    [4] [4] Alberto Tellaeche, Gonzalo Pajares, Xavier P Burgos-Artizzu, et al. A computer vision approach for weeds identification through Support Vector Machines [J]. Applied Soft Computing (S1568-4946), 2011, 11(1):908-915.

    [5] [5] Jurkovic J, Korosec M, Kopa J. New approach in tool wear measuring technique using CCD vision system [J]. International Journal of Machine Tools and Manufacture(S0890-6955), 2005, 45(9):1023-1030.

    [6] [6] YU Wenyong, ZHOU Zude, CHEN Youping. Machine vision system for on-line defect detection of float glass [J]. Journal of Huazhong University of Science and Technology:Natural Science Edition, 2007, 35(8):1-4.

    [8] [8] WANG Xue, XIE Zhijiang, SUN Hongyan, et al. Study on automatic flaw inspection system for large caliber precision optical surface [J]. Chinese Journal of Scientific Instrument, 2006, 27(10):1262-1265.

    [9] [9] LIU Xu, YANG Yongying, LIU Dong, et al. Error analysis of sub-aperture synthesis for detecting surface defects of optical components [J]. Journal of Optoelectronics. Laser, 2008, 19(8):1088-1093.

    [11] [11] PENG Zhitao, WEI Xiaofeng, YUAN Haoyu, et al. Signal noise ratio of total internal reflection edge illumination for optics damage inspection [J]. Infrared and Laser Engineering, 2011, 40(6):1111-1114.

    Tools

    Get Citation

    Copy Citation Text

    YAO Hongbing, ZENG Xiangbo, MA Guidian, ZHENG Xueliang, LI Yaru, GAO Yuan, YU Wenlong, GU Jinan, JIANG Guangping. On-line Defect Detection Method Based on Two Image Acquisition Structures[J]. Opto-Electronic Engineering, 2013, 40(11): 22

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Jul. 8, 2013

    Accepted: --

    Published Online: Dec. 4, 2013

    The Author Email: Hongbing YAO (yaoye@ujs.edu.cn)

    DOI:10.3969/j.issn.1003-501x.2013.11.004

    Topics