Opto-Electronic Engineering, Volume. 40, Issue 11, 22(2013)
On-line Defect Detection Method Based on Two Image Acquisition Structures
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YAO Hongbing, ZENG Xiangbo, MA Guidian, ZHENG Xueliang, LI Yaru, GAO Yuan, YU Wenlong, GU Jinan, JIANG Guangping. On-line Defect Detection Method Based on Two Image Acquisition Structures[J]. Opto-Electronic Engineering, 2013, 40(11): 22
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Received: Jul. 8, 2013
Accepted: --
Published Online: Dec. 4, 2013
The Author Email: Hongbing YAO (yaoye@ujs.edu.cn)
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