Infrared and Laser Engineering, Volume. 45, Issue 11, 1117004(2016)

Improving the efficiency of microwave photonics scanning frequency measurement based on vernier effect

Yu Meng, Zhang Yong, Jin Chenfei, Liu Liping, and Zhao Yuan
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  • [in Chinese]
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    References(11)

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    Yu Meng, Zhang Yong, Jin Chenfei, Liu Liping, Zhao Yuan. Improving the efficiency of microwave photonics scanning frequency measurement based on vernier effect[J]. Infrared and Laser Engineering, 2016, 45(11): 1117004

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    Paper Information

    Category: 光电测量

    Received: Mar. 5, 2016

    Accepted: Apr. 15, 2016

    Published Online: Jan. 20, 2017

    The Author Email:

    DOI:10.3788/irla201645.1117004

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