Infrared and Laser Engineering, Volume. 45, Issue 11, 1117004(2016)
Improving the efficiency of microwave photonics scanning frequency measurement based on vernier effect
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Yu Meng, Zhang Yong, Jin Chenfei, Liu Liping, Zhao Yuan. Improving the efficiency of microwave photonics scanning frequency measurement based on vernier effect[J]. Infrared and Laser Engineering, 2016, 45(11): 1117004
Paper Information
Category: 光电测量
Received: Mar. 5, 2016
Accepted: Apr. 15, 2016
Published Online: Jan. 20, 2017
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