Acta Photonica Sinica, Volume. 49, Issue 4, 0412001(2020)
A Specular Stepped Surface Profile Measurement System Based on Fringe Reflection Principle with Micrometer-level Height Resolution
Fig. 1. Schematic of stepped mirror 3D measurement system based on fringe reflection step mirror
Fig. 2. Schematic of the reverse propagation ray tracing of the fringe reflection system
Fig. 3. Simulation of the reflection ray and phase hop values and the proper structure
Fig. 4. Micron-level resolution fringe reflection 3D measurement experimental setup and physical image of the stepped mirror sample to be measured
Fig. 5. Calibration chessboard and calibration reprojection errors
Fig. 10. Step height measurement results of the test part from a white light interference microscope
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Xin-jun WAN, Song LÜ, Ke SONG, Shu-ping XIE. A Specular Stepped Surface Profile Measurement System Based on Fringe Reflection Principle with Micrometer-level Height Resolution[J]. Acta Photonica Sinica, 2020, 49(4): 0412001
Category: Instrumentation, Measurement and Metrology
Received: Dec. 17, 2019
Accepted: Jan. 17, 2020
Published Online: Apr. 24, 2020
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