Acta Photonica Sinica, Volume. 49, Issue 4, 0412001(2020)

A Specular Stepped Surface Profile Measurement System Based on Fringe Reflection Principle with Micrometer-level Height Resolution

Xin-jun WAN... Song LÜ, Ke SONG and Shu-ping XIE |Show fewer author(s)
Author Affiliations
  • School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
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    Figures & Tables(11)
    Schematic of stepped mirror 3D measurement system based on fringe reflection step mirror
    Schematic of the reverse propagation ray tracing of the fringe reflection system
    Simulation of the reflection ray and phase hop values and the proper structure
    Micron-level resolution fringe reflection 3D measurement experimental setup and physical image of the stepped mirror sample to be measured
    Calibration chessboard and calibration reprojection errors
    Reflection fringe image collected at positions 1 and 2
    Unwrapped horizontal and vertical phase diagrams
    Step mirror 3D measurement result
    Step mirror cross section analysis
    Step height measurement results of the test part from a white light interference microscope
    • Table 1. Measurement results of the step height

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      Table 1. Measurement results of the step height

      Step heightWhite light interference microscope/μmProposed method/μm
      5 μm4.9284.963±0.524
      10 μm9.8939.952±0.416
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    Xin-jun WAN, Song LÜ, Ke SONG, Shu-ping XIE. A Specular Stepped Surface Profile Measurement System Based on Fringe Reflection Principle with Micrometer-level Height Resolution[J]. Acta Photonica Sinica, 2020, 49(4): 0412001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 17, 2019

    Accepted: Jan. 17, 2020

    Published Online: Apr. 24, 2020

    The Author Email:

    DOI:10.3788/gzxb20204904.0412001

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