Optical Instruments, Volume. 42, Issue 2, 64(2020)

Study on scattering-type terahertz scanning near-field optical microscopy

Dongdong YUE and Guanjun YOU*
Author Affiliations
  • School of Optical-Electronic and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
  • show less
    References(16)

    [1] [1] ABBE E. Gesammelte abhlungen III[M]. Jena: B, 1906.

    [11] KNOLL B, KEILMANN F. Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy[J]. Optics Communications, 182, 321-328(2000).

    CLP Journals

    [1] ZHOU Qiangguo, HUANG Zhiming. ReviewofResearchandApplicationofTerahertzImagingTechnology[J]. Infrared Technology, 2022, 44(4): 328

    Tools

    Get Citation

    Copy Citation Text

    Dongdong YUE, Guanjun YOU. Study on scattering-type terahertz scanning near-field optical microscopy[J]. Optical Instruments, 2020, 42(2): 64

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: May. 10, 2019

    Accepted: --

    Published Online: May. 27, 2020

    The Author Email: YOU Guanjun (youguanjun@126.com)

    DOI:10.3969/j.issn.1005-5630.2020.02.011

    Topics