Fig. 1. Dipole model

Fig. 2. Calculated results based on the dipole model

Fig. 3. Terahertz scattering-type scanning near-field microscope system and near-field approach curves

Fig. 4. AFM topography and THz near-field microscopy images of gold thin film/silicon substrate

Fig. 5. AFM topography and THz near-field microscopy images of few-layer Graphene on SiO₂/Si substrate