[1] [1] ZHENG B K, CHEN C, LIN Y G, et al. Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process[J]. Reliability Engineering & System Safety, 2022, 217: 108087.

[4] [4] NELSON W, KIELPINSKI T J. Theory for optimum censored accelerated life tests for normal and lognormal life distributions[J]. Technometrics, 1976, 18(1): 105-114.

[5] [5] NELSON W, MEEKER W Q. Theory for optimum accelerated censored life tests for Weibull and extreme value distributions[J]. Technometrics, 1978, 20(2): 171-177.

[13] [13] WANG H, ZHAO Y, MA X B, et al. Optimal design of constant-stress accelerated degradation tests using the M-optimality criterion[J]. Reliability Engineering & System Safety, 2017, 164: 45-54.

[15] [15] YE Z S, CHEN L P, TANG L C, et al. Accelerated degradation test planning using the inverse Gaussian process[J]. IEEE Transactions on Reliability, 2014, 63(3): 750-763.

[16] [16] HU C H, LEE M Y, TANG J. Optimum step-stress accelerated degradation test for Wiener degradation process under constraints[J]. European Journal of Operational Research, 2015, 241(2): 412-421.

[17] [17] WANG H, WANG G J, DUAN F J. Planning of step-stress accelerated degradation test based on the inverse Gaussian process[J]. Reliability Engineering & System Safety, 2016, 154: 97-105.