Electronics Optics & Control, Volume. 32, Issue 2, 79(2025)

MRE-ADT Optimization Design for Accelerated Degradation Test Under Weibull Distribution

QI Yang1,2 and SUO Bin1,2
Author Affiliations
  • 1Southwest University of Science and Technology, School of Information Engineering, Mianyang 621000, China
  • 2Southwest University of Science and Technology, Complex Environment Equipment Reliability Research Center, Mianyang 621000, China
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    QI Yang, SUO Bin. MRE-ADT Optimization Design for Accelerated Degradation Test Under Weibull Distribution[J]. Electronics Optics & Control, 2025, 32(2): 79

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    Paper Information

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    Received: Dec. 12, 2023

    Accepted: Feb. 20, 2025

    Published Online: Feb. 20, 2025

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2025.02.013

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