Electronics Optics & Control, Volume. 32, Issue 2, 79(2025)
MRE-ADT Optimization Design for Accelerated Degradation Test Under Weibull Distribution
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QI Yang, SUO Bin. MRE-ADT Optimization Design for Accelerated Degradation Test Under Weibull Distribution[J]. Electronics Optics & Control, 2025, 32(2): 79
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Received: Dec. 12, 2023
Accepted: Feb. 20, 2025
Published Online: Feb. 20, 2025
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