Fig. 1. Dual 1 064 nm laser dual delay detection optical path

Fig. 2. Nanosecond laser damage threshold measurement system appearance

Fig. 3. Software control and limitation defect identification interface

Fig. 4. Recognition repeatability of defects of different sizes in continuous scanning images during raster scan measurement

Fig. 5. Laser damage transient measurement based on pump-probe technology

Fig. 6. LIDT of 1 064 nm highly reflective thin films

Fig. 7. Raster scan measurement of high reflective films at 1 064nm

Fig. 8. Transient diagnosis of laser damage source of transmission element

Fig. 9. In-situ measurement and reset accuracy

Fig. 10. Comparison of plasma eruption characteristics in vacuum and atmosphere

Fig. 11. Damage morphology and damage threshold of nodular tumor under femtosecond laser irradiation

Fig. 12. Damage morphology and damage threshold of nodular tumor under nanosecond laser irradiation

Fig. 13. Initial damage morphology and damage growth pattern of dozens of microns

Fig. 14. Shell initial damage morphology and size information

Fig. 15. Initial damage morphology and damage growth rule of micro-nano size

Fig. 16. Damage morphologies of highly reflective films at different wavelengths