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Chinese Journal of Quantum Electronics, Volume. 32, Issue 2, 161(2015)

Fault detection and location for quantum circuits based on NCV gates

Jinfeng HE1,*... Zhijin GUAN2, Xueyun CHENG2, Keren YU2 and Mingqiang XU3 |Show fewer author(s)
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    HE Jinfeng, GUAN Zhijin, CHENG Xueyun, YU Keren, XU Mingqiang. Fault detection and location for quantum circuits based on NCV gates[J]. Chinese Journal of Quantum Electronics, 2015, 32(2): 161

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    Received: Apr. 28, 2014

    Accepted: --

    Published Online: Apr. 14, 2015

    The Author Email: Jinfeng HE (12110009@yjs.ntu.edu.cn)

    DOI:10.3969/j.issn.1007-5461. 2015.02.006

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology