Chinese Journal of Quantum Electronics, Volume. 32, Issue 2, 161(2015)

Fault detection and location for quantum circuits based on NCV gates

Jinfeng HE1、*, Zhijin GUAN2, Xueyun CHENG2, Keren YU2, and Mingqiang XU3
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    In order to ensure the correctness and effectiveness of quantum circuits constructed on the basis of NCV gates library, fault localization tree generating algorithm and black box testing algorithm were introduced to locate the missing-gate faults in the quantum circuits. This algorithm generates fault localization trees layer by layer by eliminating approximate 98% of inefficient output vector, and meanwhile extracting the effective input vector and the corresponding responded output from the fault output table. In quantum circuit missing-fault gates can be effectively located in the process of fault locating without an access to the output table. The results of the experiment on part of the benchmarks circuits also show the effectivity of this algorithm for fault gates locating.

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    HE Jinfeng, GUAN Zhijin, CHENG Xueyun, YU Keren, XU Mingqiang. Fault detection and location for quantum circuits based on NCV gates[J]. Chinese Journal of Quantum Electronics, 2015, 32(2): 161

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    Paper Information

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    Received: Apr. 28, 2014

    Accepted: --

    Published Online: Apr. 14, 2015

    The Author Email: Jinfeng HE (12110009@yjs.ntu.edu.cn)

    DOI:10.3969/j.issn.1007-5461. 2015.02.006

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