Fig. 1. Schematic diagram of single-layer SiO₂ film containing defects irradiated by laser

Fig. 2. Light field distribution of SiO₂ film induced by defect

Fig. 3. Light field distribution of SiO₂ film induced by defect with different refractive index

Fig. 4. Dependence of peak light field on the refractive index of defect

Fig. 5. Light field distribution of films induced by defect with different depths

Fig. 6. Light field distribution of films induced by defect with different sizes

Fig. 7. Light field distribution under laser wavelength of 355 nm (a), 532 nm (b), 1 064 nm (c)