Fig. 1. Experimental setup used to characterize the sample and cross-section detail of perovskite coating on the coverslips.

Fig. 2. SEM image of the cross section of a coverslips coated with perovskite film: (a) The mean value of the thickness measured on different portions from sample was 114 nm. (b) The mean value of the thickness of the sample 2 was 276 nm. (c) The mean value of the thickness of the sample 3 was 648 nm. (d) XRD pattern of perovskite. (e) Complex refractive index real part (Re N or n) and imaginary part of extinction coefficient (Im N or k) of perovskite obtained from spectroscopic ellipsometry.

Fig. 3. Evolution of calculated LMRs in the transmission spectrums vs. coating thickness and overlay of the experimental LMRs minimums.

Fig. 4. Theoretical and experimental transmission spectra of perovskite thin films with different thicknesses on planar waveguides: (a) 114 nm, (b) 276 nm, (c) 648 nm.