Journal of the Chinese Ceramic Society, Volume. 51, Issue 4, 899(2023)
Key Problems in Microwave Dielectric Characterization of Low-Dielectric-Constant Ceramics
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LI Lei, CHΕN Xiangming. Key Problems in Microwave Dielectric Characterization of Low-Dielectric-Constant Ceramics[J]. Journal of the Chinese Ceramic Society, 2023, 51(4): 899
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Received: Aug. 31, 2022
Accepted: --
Published Online: Apr. 15, 2023
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CSTR:32186.14.
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