Acta Optica Sinica, Volume. 42, Issue 10, 1012004(2022)

Measurement Method for Surface Defects on ICF Capsules Based on White Light Interferometry

Zhiyao Yin, Renhui Guo*, Xin Yang, Chengxing Liu, and Jianxin Li
Author Affiliations
  • School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, Jiangsu, China
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    Figures & Tables(12)
    Measurement optical path for surface defects of ICF capsule using Linnik type white light null micro-interference
    Step surface with bat-wing effect and corrected step surface. (a) Ideal step surface; (b) step surface with bat-wing effect; (c) step surface obtained by bat-wing correction algorithm
    Flowchart of white light phase-shifting interference algorithm
    Experimental devices. (a) Measurement device of white light null micro-interference; (b) measurement device of laser micro-interference
    White light interferograms of seven-step phase-shifting
    Intensity and modulation of white light interference. (a) Interference fringe intensity; (b) interference fringe modulation
    Surface morphology of ICF capsule obtained by white light interferometry. (a) Three-dimensional image; (b) isolated defect
    Surface morphology of ICF capsule when bat-wing effect is eliminated. (a) Three-dimensional image; (b) isolated defect
    Laser interferograms of four-step phase-shifting. (a) 0; (b) π/2; (c) π; (d) 3π/2
    Surface morphology of ICF capsule by laser interferometry. (a) Three-dimensional image; (b) isolated defect
    Height profiles of ICF capsule defect in different directions measured by white light interferometry. (a) X-direction; (b) Y-direction
    Height profiles in different directions of ICF capsule defect measured by laser interferometry. (a) X-direction; (b) Y-direction
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    Zhiyao Yin, Renhui Guo, Xin Yang, Chengxing Liu, Jianxin Li. Measurement Method for Surface Defects on ICF Capsules Based on White Light Interferometry[J]. Acta Optica Sinica, 2022, 42(10): 1012004

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Oct. 8, 2021

    Accepted: Dec. 20, 2021

    Published Online: May. 10, 2022

    The Author Email: Guo Renhui (grh@njust.edu.cn)

    DOI:10.3788/AOS202242.1012004

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