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Acta Optica Sinica, Volume. 42, Issue 10, 1012004(2022)

Measurement Method for Surface Defects on ICF Capsules Based on White Light Interferometry

Zhiyao Yin, Renhui Guo*, Xin Yang, Chengxing Liu, and Jianxin Li
Author Affiliations
  • School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, Jiangsu, China
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    Article index updated:May. 24, 2024

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    Zhiyao Yin, Renhui Guo, Xin Yang, Chengxing Liu, Jianxin Li. Measurement Method for Surface Defects on ICF Capsules Based on White Light Interferometry[J]. Acta Optica Sinica, 2022, 42(10): 1012004

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Oct. 8, 2021

    Accepted: Dec. 20, 2021

    Published Online: May. 10, 2022

    The Author Email: Guo Renhui (grh@njust.edu.cn)

    DOI:10.3788/AOS202242.1012004

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology