Assessment Method of Ultraviolet Spot Area for Insulators Based on Improved ANFIS

Guohui XU; Hongwei XIE; Tongfa LYU; Xin MOU; Mingzheng BAO; Chao LYU

Infrared Technology, Volume. 45, Issue 12, 1346(2023)

Guohui XU... Hongwei XIE, Tongfa LYU, Xin MOU, Mingzheng BAO and Chao LYU |Show fewer author(s)

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[10] [10] LI Heming, DAI Rijun, LI Man. Insulator ultraviolet discharge feature extraction based on level set[C]//IEEE International Conference on Electrical and Control Engineering, 2011: 2283-2286.

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XU Guohui, XIE Hongwei, LYU Tongfa, MOU Xin, BAO Mingzheng, LYU Chao. Assessment Method of Ultraviolet Spot Area for Insulators Based on Improved ANFIS[J]. Infrared Technology, 2023, 45(12): 1346

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