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Infrared Technology, Volume. 45, Issue 12, 1346(2023)

Assessment Method of Ultraviolet Spot Area for Insulators Based on Improved ANFIS

Guohui XU... Hongwei XIE, Tongfa LYU, Xin MOU, Mingzheng BAO and Chao LYU |Show fewer author(s)
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    XU Guohui, XIE Hongwei, LYU Tongfa, MOU Xin, BAO Mingzheng, LYU Chao. Assessment Method of Ultraviolet Spot Area for Insulators Based on Improved ANFIS[J]. Infrared Technology, 2023, 45(12): 1346

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    Received: Mar. 9, 2021

    Accepted: --

    Published Online: Jan. 17, 2024

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    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology