Infrared and Laser Engineering, Volume. 52, Issue 6, 20230168(2023)

Irradiation effect of 2.79 μm mid-infrared laser on CMOS image sensor

Xi Wang1,2, Nanxiang Zhao1,2, Yongning Zhang3, Biyi Wang3, Xiao Dong1,2, Yan Zou4, Wuhu Lei1,2, and Yihua Hu1,2、*
Author Affiliations
  • 1State Key Laboratory of Pulsed Power Laser Technology, Electronic Countermeasure Institute, National University of Defense Technology, Hefei 230037, China
  • 2Anhui Laboratory of Advanced Laser Technology, Electronic Countermeasure Institute, National University of Defense Technology, Hefei 230037, China
  • 3National Key Laboratory of Electromagnetic Space Security, Tianjin 300308, China
  • 4Beijing Institute of Aerospace Control Devices, Beijing 100094, China
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    References(20)

    [4] Mengzhen Zhu, Yun Liu, Chaowei Mi, . Experimental study on a CMOS image sensor damaged by a composite laser. Infrared and Laser Engineering, 51, 20210537(2022).

    [6] A Witze. Software error doomed Japanese Hitomi spacecraft. Nature, 533, 17(2016).

    [8] Chaoliang Yong, Jianchun Lin, . Mosaic of spatial large scale CMOS focal plane array. Infrared and Laser Engineering, 41, 2561-2566(2012).

    [9] Hua Li, Xi Wang, Jinsong Nie, . Influence of pulse width on damage effects of CCD detector induced by laser. Infrared and Laser Engineering, 42, 403-406(2013).

    [13] Xi Wang, Jinsong Nie, Hua Li, . Experiment research on 1064 nm laser of high pulse-repetition- frequency disturbing visible CCD detectors. Infrared and Laser Engineering, 42, 387-390(2013).

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    Xi Wang, Nanxiang Zhao, Yongning Zhang, Biyi Wang, Xiao Dong, Yan Zou, Wuhu Lei, Yihua Hu. Irradiation effect of 2.79 μm mid-infrared laser on CMOS image sensor[J]. Infrared and Laser Engineering, 2023, 52(6): 20230168

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    Paper Information

    Category: Image processing

    Received: Mar. 24, 2023

    Accepted: --

    Published Online: Jul. 26, 2023

    The Author Email: Hu Yihua (yh_hu@263.net)

    DOI:10.3788/IRLA20230168

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