Infrared and Laser Engineering, Volume. 52, Issue 6, 20230168(2023)

Irradiation effect of 2.79 μm mid-infrared laser on CMOS image sensor

Xi Wang1,2, Nanxiang Zhao1,2, Yongning Zhang3, Biyi Wang3, Xiao Dong1,2, Yan Zou4, Wuhu Lei1,2, and Yihua Hu1,2、*
Author Affiliations
  • 1State Key Laboratory of Pulsed Power Laser Technology, Electronic Countermeasure Institute, National University of Defense Technology, Hefei 230037, China
  • 2Anhui Laboratory of Advanced Laser Technology, Electronic Countermeasure Institute, National University of Defense Technology, Hefei 230037, China
  • 3National Key Laboratory of Electromagnetic Space Security, Tianjin 300308, China
  • 4Beijing Institute of Aerospace Control Devices, Beijing 100094, China
  • show less
    Figures & Tables(10)
    Experimental system of laser irradiation effect
    CMOS image sensor
    Time of irradiation effect vs laser energy (Repetition frequency 5 Hz)
    Phenomenon of oversaturation
    Time of irradiation effect vs. laser energy (Repetition frequency 10 Hz)
    Phenomenon of green screen
    Damage phenomenon of CMOS
    Time of irradiation effect vs. sensor laser energy (5 Hz) ① saturated/oversaturated, ② green screen, ③ oversaturated, ④ green screen, ⑤ damage
    Time of irradiation effect vs. sensor laser energy (10 Hz) ① saturated, ② oversaturated, ③ stagnation of picture, ④ oversaturated, ⑤ green screen, ⑥ damage
    Damage morphology of CMOS image sensor (203.71 J/cm2, 10 Hz)
    Tools

    Get Citation

    Copy Citation Text

    Xi Wang, Nanxiang Zhao, Yongning Zhang, Biyi Wang, Xiao Dong, Yan Zou, Wuhu Lei, Yihua Hu. Irradiation effect of 2.79 μm mid-infrared laser on CMOS image sensor[J]. Infrared and Laser Engineering, 2023, 52(6): 20230168

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Image processing

    Received: Mar. 24, 2023

    Accepted: --

    Published Online: Jul. 26, 2023

    The Author Email: Hu Yihua (yh_hu@263.net)

    DOI:10.3788/IRLA20230168

    Topics