Journal of Terahertz Science and Electronic Information Technology , Volume. 19, Issue 3, 537(2021)
Design of an integrated circuit function test system based on V58300 platform
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TIANQiang, YANG Wanwan, LI Linan, GUO Gang, CAI Li, LIU Hainan, LUO Jiajun. Design of an integrated circuit function test system based on V58300 platform[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(3): 537
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Received: Oct. 24, 2019
Accepted: --
Published Online: Aug. 19, 2021
The Author Email: Wanwan YANG (yangwanwan@ime.ac.cn)