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Journal of Terahertz Science and Electronic Information Technology , Volume. 19, Issue 3, 537(2021)

Design of an integrated circuit function test system based on V58300 platform

TIANQiang1,2,3, YANG Wanwan2,3、*, LI Linan1, GUO Gang4,5, CAI Li4,5, LIU Hainan2,3, and LUO Jiajun2,3
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
  • 5[in Chinese]
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    TIANQiang, YANG Wanwan, LI Linan, GUO Gang, CAI Li, LIU Hainan, LUO Jiajun. Design of an integrated circuit function test system based on V58300 platform[J]. Journal of Terahertz Science and Electronic Information Technology , 2021, 19(3): 537

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    Received: Oct. 24, 2019

    Accepted: --

    Published Online: Aug. 19, 2021

    The Author Email: Wanwan YANG (yangwanwan@ime.ac.cn)

    DOI:10.11805/tkyda2019422

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology