Acta Optica Sinica, Volume. 40, Issue 1, 111010(2020)

Phase Imaging Based on Ptychography and Progress on Related Key Techniques

Pan Xingchen1,2、*, Liu Cheng1,2, Tao Hua1,2, Liu Haigang3, and Zhu Jianqiang1,2
Author Affiliations
  • 1Key Laboratory of High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2National Laboratory on High Power Laser and Physics, China Academy of Engineering Physics, Chinese Academy of Sciences, Shanghai 201800, China
  • 3Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
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    Figures & Tables(26)
    Schematic of basic optical path of Ptychography
    Flow chart of primary iteration for single-layer Ptychography
    Amplitude and phase distributions of specimen reconstructed by ePIE. (a) Amplitude; (b) phase
    Flow chart of multi-mode Ptychography algorithm
    Reconstructed results of wavefront. (a)-(c) Experimental results with partially coherent X-rays[13]. (a) is result reconstructed by single-mode Ptychography and (b)(c) are distributions of specimen and lighting probes reconstructed by 12-mode Ptychography, respectively [43]; (d) left-bottom inset is reconstructed results of multi-mode color imaging and top-right inset is imaging result under white
    Influence of translation error on reconstructed results. (a)(b) Reconstructed amplitude and phase of specimen and lighting probe with scanning errors; (c)(d) reconstructed amplitude and phase of specimen and lighting probe with accurate positions
    Principle of correlation matching algorithm. (a) Reconstructed amplitude of object at first position; (b) reconstructed amplitudes of object at two positions
    Experimental results[14]. (a) Resolution plate reconstructed without position correction; (b) reconstructed result of correlation matching algorithm with position correction
    Basic schematic of annealing algorithm
    Imaging results of gold/graphite particles under electron beam microscopy[15]. (a) Reconstructed result before position corrections; (b) reconstructed result after position corrections by annealing algorithm
    Influence of distance errors. (a) Schematic of actual optical path; (b) equivalent optical path for distance measurement with error
    Simulation results[51] (unit of scale bar is 100 pixel). (a) Real distribution of specimen; (b) reconstructed result when distance is reduced by half; (c) reconstructed result after lighting probe multiplies lens factor when distance is reduced by half
    Schematic of super resolution. (a) Light spot recorded by facular detector with limited numerical aperture; (b) schematic of amplitude updating algorithm
    Experimental results of super resolution[17]. (a)(b) Amplitude and phase distributions of pollens reconstructed by standard PIE; (c)(d) amplitude and phase distributions of pollens reconstructed by SR-PIE
    Results of reconstruction experiments when light spots are partially saturated[54]. (a)-(d) Light spots with increasing saturated area from 0; (e)-(h) resolution-plate distributions reconstructed by corresponding saturated light spots in Figs. 15(a)-(d)
    Schematic of amplitude updating algorithm for under-sampling
    Experimental results. (a)-(d) Under-sampled diffraction spots and corresponding reconstructed results; (e)-(h) diffraction spots after linear interpolation for spot in Fig. 17(a) and corresponding reconstructed results; (i)-(l) diffraction spot, lighting probe, and resolution plate reconstructed by under-sampled Ptychography algorithm
    Experimental results with X-rays. (a)-(d) Normal sampling; (c)-(h) sampling rate decreased to 1/8; (i)-(l) sampling rate decreased to 1/16
    Schematic of basic optical path of 3PIE
    Experimental results of 3PIE stratified imaging[16]. (a)(d) Images of different focusing slices recorded by microscope; (b)(c) amplitude reconstructed by 3PIE; (e)(f) phase reconstructed by 3PIE
    Basic principal of standard Ptychography. (a) Traditional position-by-position scanning mode; (b) continuous recording mode; (c) decomposition of continuous recording process into multiple independent modes
    Experimental results of Fly-PIE[59]. (a)-(d) Diffraction spots recorded by continuous exposure when specimen is translated with different speeds; (e) reconstructed results with single and multiple modes; (f) reconstructed lighting probes with multiple modes
    Schematic of single-exposure Ptychography based on grating splitting
    Experimental results reconstructed by Ptychography based on grating splitting [19]. (a) Light spots; (b) reconstructed amplitude of specimen; (c) reconstructed phase of specimen
    Schematic of single-exposure Ptychography based on 4f system
    Experimental results with single-exposure Ptychography based on 4f system[20]. (a) (b) Reconstructed amplitude and phase of specimen; (c) reconstructed lighting probe; (d) direct-imaging result
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    Pan Xingchen, Liu Cheng, Tao Hua, Liu Haigang, Zhu Jianqiang. Phase Imaging Based on Ptychography and Progress on Related Key Techniques[J]. Acta Optica Sinica, 2020, 40(1): 111010

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    Paper Information

    Special Issue:

    Received: Sep. 30, 2019

    Accepted: --

    Published Online: Jan. 6, 2020

    The Author Email: Xingchen Pan (xchpan@siom.ac.cn)

    DOI:10.3788/AOS202040.0111010

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