Researching | Phase Imaging Based on Ptychography and Progress on Related Key Techniques

Acta Optica Sinica, Volume. 40, Issue 1, 111010(2020)

Phase Imaging Based on Ptychography and Progress on Related Key Techniques

Pan Xingchen^1,2、*, Liu Cheng^1,2, Tao Hua^1,2, Liu Haigang³, and Zhu Jianqiang^1,2

Author Affiliations

¹Key Laboratory of High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²National Laboratory on High Power Laser and Physics, China Academy of Engineering Physics, Chinese Academy of Sciences, Shanghai 201800, China

³Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China

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Pan Xingchen, Liu Cheng, Tao Hua, Liu Haigang, Zhu Jianqiang. Phase Imaging Based on Ptychography and Progress on Related Key Techniques[J]. Acta Optica Sinica, 2020, 40(1): 111010

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Paper Information

Special Issue:

Received: Sep. 30, 2019

Accepted: --

Published Online: Jan. 6, 2020

The Author Email: Xingchen Pan (xchpan@siom.ac.cn)

DOI:10.3788/AOS202040.0111010

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology