Microelectronics, Volume. 53, Issue 2, 338(2023)
Study on the Correlation Between Single Event Transient and Fin Structure of Nano FinFET
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LIU Baojun, CHEN Minghua. Study on the Correlation Between Single Event Transient and Fin Structure of Nano FinFET[J]. Microelectronics, 2023, 53(2): 338
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Received: May. 30, 2022
Accepted: --
Published Online: Dec. 15, 2023
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