Microelectronics, Volume. 54, Issue 2, 293(2024)
Breakdown Simulation Analysis of Asymmetric Resistive Field Plate Field Effect Devices
Get Citation
Copy Citation Text
YAO Chuanjian, XIAO Tian, LI Xiaoquan, HE Yue, TAN Kaizhou. Breakdown Simulation Analysis of Asymmetric Resistive Field Plate Field Effect Devices[J]. Microelectronics, 2024, 54(2): 293
Category:
Received: Jan. 23, 2024
Accepted: --
Published Online: Aug. 21, 2024
The Author Email: