Microelectronics, Volume. 54, Issue 2, 293(2024)

Breakdown Simulation Analysis of Asymmetric Resistive Field Plate Field Effect Devices

YAO Chuanjian1...2, XIAO Tian1, LI Xiaoquan1, HE Yue1,2, and TAN Kaizhou12 |Show fewer author(s)
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    YAO Chuanjian, XIAO Tian, LI Xiaoquan, HE Yue, TAN Kaizhou. Breakdown Simulation Analysis of Asymmetric Resistive Field Plate Field Effect Devices[J]. Microelectronics, 2024, 54(2): 293

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    Received: Jan. 23, 2024

    Accepted: --

    Published Online: Aug. 21, 2024

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    DOI:10.13911/j.cnki.1004-3365.240120

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