Acta Photonica Sinica, Volume. 52, Issue 2, 0212001(2023)

Microscopy Measurement Method of Microstructure Linewidth Based on Translation Difference

Jianqiu MA1... Zhishan GAO1,*, Qun YUAN1, Zhenyan GUO1, Yifeng SUN1, Lihua LEI2 and Lin ZHAO3 |Show fewer author(s)
Author Affiliations
  • 1School of Electronic and Optical Engineering,Nanjing University of Science and Technology,Nanjing 210094,China
  • 2Shanghai Institute of Metrology and Testing Technology,Shanghai 201203,China
  • 3The 13th Institute of China Electronics Technology Corporation,Shijiazhuang 050051,China
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    Figures & Tables(12)
    Step-edge imaging light intensity distribution
    One-step translation difference method
    Gradient distribution of PSF
    Effect of translation distance on differential sensitivity
    Influence of unstable illumination on differential pulses
    Two-step translation difference method
    Microscopic direct imaging experimental system
    Standard template design
    Microscopic images of the samples
    Differential data
    Measurement repeatability data
    • Table 1. Standard template measurement report

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      Table 1. Standard template measurement report

      ParametersNominal value/μmCalibration value/μmUrelk=2
      Width3030.000.7%
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    Jianqiu MA, Zhishan GAO, Qun YUAN, Zhenyan GUO, Yifeng SUN, Lihua LEI, Lin ZHAO. Microscopy Measurement Method of Microstructure Linewidth Based on Translation Difference[J]. Acta Photonica Sinica, 2023, 52(2): 0212001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Oct. 27, 2022

    Accepted: Dec. 14, 2022

    Published Online: Mar. 28, 2023

    The Author Email: GAO Zhishan (zhishgao@njust.edu.cn)

    DOI:10.3788/gzxb20235202.0212001

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