Laser & Optoelectronics Progress, Volume. 58, Issue 20, 2012002(2021)
An Efficient Rivet Flushness Measurement Method Based on Image-to-Point-Cloud Mapping
Fig. 1. Flow chart of rivet flushness measurement algorithm
Fig. 2. Skin surface condition. (a) Image of skin surface; (b) Canny edge detection
Fig. 3. Two geometric features of contour inflection point
Fig. 4. Contour segmentation based on neighborhood features. (a)(b)(c) Original contours disturbed by noise; (d)(e)(f) neighborhood features at the inflection point of the contours
Fig. 5. Three kinds of neighborhood features at the inflection point of the rivet contour
Fig. 6. Contour segmentation based on neighborhood features. (a)(b)(c) Contour segmentation
Fig. 7. Rivet contour extraction result corresponding to the skin image shown in
Fig. 8. Mapping relationship between camera pixel and three-dimensional point
Fig. 9. Rivet segmentation in point cloud based on image-point cloud mapping. (a) Extraction of rivet contour in image; (b) rivet segmentation in point cloud
Fig. 10. Rivet segmentation in point cloud based on PCL
Fig. 11. Measurement system for rivet flushness. (a) Hardware of measurement system; (b) software interface
Fig. 12. Standard part and its measurement result. (a)Standard part; (b)measurement result of standard part
Fig. 13. Skin part to be measured
Fig. 14. Images and reconstruction results before and after introducing adaptive projection measurement method. (a)(b) Before introducing adaptive projection measurement method; (c)(d) after introducing adaptive projection measurement method
Fig. 15. Rivet contour extraction and point cloud segmentation. (a) Canny edge detection result; (b) smooth contour after segmentation based on inflection point; (c) extracted rivet contour; (d) point cloud segmentation based on rivet image contour
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Ronghui Guo, Yihua Zhang, Haihua Cui, Xiaosheng Cheng, Lanzhu Li. An Efficient Rivet Flushness Measurement Method Based on Image-to-Point-Cloud Mapping[J]. Laser & Optoelectronics Progress, 2021, 58(20): 2012002
Category: Instrumentation, Measurement and Metrology
Received: Dec. 2, 2020
Accepted: Jan. 21, 2021
Published Online: Oct. 14, 2021
The Author Email: Cui Haihua (cuihh@nuaa.edu.cn)