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Laser & Optoelectronics Progress, Volume. 58, Issue 20, 2012002(2021)

An Efficient Rivet Flushness Measurement Method Based on Image-to-Point-Cloud Mapping

Ronghui Guo1, Yihua Zhang1, Haihua Cui1、*, Xiaosheng Cheng1, and Lanzhu Li2
Author Affiliations
  • 1College of Mechanical and Electrical Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, Jiangsu 210016, China
  • 2Institute of Aerospace Materials and Technology, Beijing 100048, China
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    Article index updated:May. 21, 2024

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    Ronghui Guo, Yihua Zhang, Haihua Cui, Xiaosheng Cheng, Lanzhu Li. An Efficient Rivet Flushness Measurement Method Based on Image-to-Point-Cloud Mapping[J]. Laser & Optoelectronics Progress, 2021, 58(20): 2012002

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 2, 2020

    Accepted: Jan. 21, 2021

    Published Online: Oct. 14, 2021

    The Author Email: Cui Haihua (cuihh@nuaa.edu.cn)

    DOI:10.3788/LOP202158.2012002

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology