Infrared and Laser Engineering, Volume. 50, Issue 11, 20210453(2021)

Temperature dependency of InGaAs/InP single photon avalanche diode for 1 550 nm photons

Shuai Wang1,2, Qin Han1,2,3、*, Han Ye1,2, Liyan Geng1,2, Ziqing Lu1,2, Feng Xiao1,2, and Fan Xiao1,2
Author Affiliations
  • 1State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 2Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
  • 3School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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    Figures & Tables(6)
    Cross-section of the SPAD structure and its internal electric field distribution
    (a) Dark current and photocurrent at 1 550 nm as a function of bias voltage for SPAD at temperature of 223-293 K;(b) Breakdown voltage versus temperature data (symbols) and linear fitting (line)
    Temperature dependence of PDE and DCR of 25 μm diameter SPADs (color online)
    Activation energies of DCR at 2 V excess bias
    PDE and DCR dependence on excess bias of 25 μm-diameter SPAD at 223 K
    Relationship between APP and the operate temperature at 2 V excess bias
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    Shuai Wang, Qin Han, Han Ye, Liyan Geng, Ziqing Lu, Feng Xiao, Fan Xiao. Temperature dependency of InGaAs/InP single photon avalanche diode for 1 550 nm photons[J]. Infrared and Laser Engineering, 2021, 50(11): 20210453

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    Paper Information

    Category: Infrared technology and application

    Received: May. 10, 2021

    Accepted: --

    Published Online: Dec. 7, 2021

    The Author Email: Han Qin (hanqin@semi.ac.cn)

    DOI:10.3788/IRLA20210453

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