Opto-Electronic Engineering, Volume. 36, Issue 9, 52(2009)
Baseline Auto-fitting with Cumulant Analysis for Nano-particle
[1] [1] Cummins H Z,Pike E R. Photon Correlation and Light Beating Spectroscopy [M]. New York:Plenum,1977.
[2] [2] Dahneke B E. Measurement of Suspended Particles by Quasi-elastic Light Scattering [M]. New York:Wiley-interscience,1983.
[3] [3] Theodore Provder. Challenges in particle size distribution measurement past,present and for the 21st century [J]. Progress in Organic Coalings(S0300-9440),1997,32(1/4):143-153.
[5] [5] Jillavenkatesa A,Kelly J F. Nanopowder characterization:challenges and future directions [J]. Journal of nanoparticle Research(S1388-0764),2002,4:463-468.
[6] [6] Hassan P A,Kulshreshtha S K. Modification to the cumulant analysis of polydispersity in quasielastic light scattering data [J]. Journal of Colloid and Interface Science (S0021-9797),2006,300:744-748.
[7] [7] Instruction Manual for BI-9000AT Digital Autocorrelator [Z]. New York:Holtsville,Brookhaven Instruments Corporation,1989.
[8] [8] Lawson C L,Richard J H. Solving Least Squares Problems [M]. Englewood:Prentice Hall,1974:319-342.
[10] [10] LIU Gui-qiang,YANG Guan-ling,ZHOU Shu-cang,et al. Analysis on the Effect of Baseline Value on the Inversion Results of Cumulant Method in PCS [J]. Opto-Electronic Engineering,2007,35(3):88-92
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KONG Ming, ZHAO Jun, LI Chun-yan. Baseline Auto-fitting with Cumulant Analysis for Nano-particle[J]. Opto-Electronic Engineering, 2009, 36(9): 52
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Received: Mar. 12, 2009
Accepted: --
Published Online: Jan. 31, 2010
The Author Email: Ming KONG (mkong@cjlu.edu.cn)