Opto-Electronic Engineering, Volume. 36, Issue 9, 52(2009)

Baseline Auto-fitting with Cumulant Analysis for Nano-particle

KONG Ming*... ZHAO Jun and LI Chun-yan |Show fewer author(s)
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    KONG Ming, ZHAO Jun, LI Chun-yan. Baseline Auto-fitting with Cumulant Analysis for Nano-particle[J]. Opto-Electronic Engineering, 2009, 36(9): 52

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    Paper Information

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    Received: Mar. 12, 2009

    Accepted: --

    Published Online: Jan. 31, 2010

    The Author Email: Ming KONG (mkong@cjlu.edu.cn)

    DOI:10.3969/j.issn.1003-501x.2009.09.010

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