Opto-Electronic Engineering, Volume. 36, Issue 9, 52(2009)
Baseline Auto-fitting with Cumulant Analysis for Nano-particle
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KONG Ming, ZHAO Jun, LI Chun-yan. Baseline Auto-fitting with Cumulant Analysis for Nano-particle[J]. Opto-Electronic Engineering, 2009, 36(9): 52
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Received: Mar. 12, 2009
Accepted: --
Published Online: Jan. 31, 2010
The Author Email: Ming KONG (mkong@cjlu.edu.cn)
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