Infrared and Laser Engineering, Volume. 53, Issue 3, 20230614(2024)

Method for measuring laser damage threshold of optical thin film elements based on quantitative damage evaluation

Lei Xin, Zhongming Yang*, Jun Meng, and Zhaojun Liu
Author Affiliations
  • School of Information Science and Engineering, Shandong University, Qingdao 266237, China
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    References(20)

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    Lei Xin, Zhongming Yang, Jun Meng, Zhaojun Liu. Method for measuring laser damage threshold of optical thin film elements based on quantitative damage evaluation[J]. Infrared and Laser Engineering, 2024, 53(3): 20230614

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    Paper Information

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    Received: Nov. 6, 2023

    Accepted: --

    Published Online: Jun. 21, 2024

    The Author Email: Yang Zhongming (zhongming.yang@sdu.edu.cn)

    DOI:10.3788/IRLA20230614

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