Infrared and Laser Engineering, Volume. 53, Issue 3, 20230614(2024)
Method for measuring laser damage threshold of optical thin film elements based on quantitative damage evaluation
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Lei Xin, Zhongming Yang, Jun Meng, Zhaojun Liu. Method for measuring laser damage threshold of optical thin film elements based on quantitative damage evaluation[J]. Infrared and Laser Engineering, 2024, 53(3): 20230614
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Received: Nov. 6, 2023
Accepted: --
Published Online: Jun. 21, 2024
The Author Email: Yang Zhongming (zhongming.yang@sdu.edu.cn)